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    Created: 2020-12-11 19:29:13     Modified: 2020-12-11 19:33:11
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C.D. Fuentes, S. Kouro and S. Bernet. Comparison of 1700-V SiC-MOSFET and Si-IGBT Modules Under Identical Test Setup Conditions. In IEEE Transactions on Industry Applications, Vol. 55(6):7765–7775, December 2019.
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