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Publication no #3507   Download bibtex file Type :   Html | Bib | Both
    Created: 2014-06-04 16:40:11     Modified: 2014-06-04 16:42:52
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F Faccio, B. Allongue, G Blanchot, C. Fuentes, S Michelis, S Orlandi and R. Sorge. TID and Displacement Damage Effects in Vertical and Lateral Power MOSFETs for Integrated DC-DC Converters. In IEEE Transactions on Nuclear Science, Vol. 57(4):1790-1797, August 2010. URL
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@Article{fuentes:2010,
      AUTHOR = {Faccio, F and Allongue, B. and Blanchot, G and Fuentes, C. and Michelis, S and Orlandi, S and Sorge, R.},
      TITLE = {TID and Displacement Damage Effects in Vertical and Lateral Power MOSFETs for Integrated DC-DC Converters},
      YEAR = {2010},
      MONTH = {August},
      JOURNAL = {IEEE Transactions on Nuclear Science},
      VOLUME = {57},
      NUMBER = {4},
      PAGES = {1790-1797},
      URL = {http://dx.doi.org/10.1109/TNS.2010.2049584},
      NOTE = {ISI}
}
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