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    Created: 2014-06-04 16:40:11     Modified: 2014-06-04 16:42:52
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F Faccio, B. Allongue, G Blanchot, C. Fuentes, S Michelis, S Orlandi and R. Sorge. TID and Displacement Damage Effects in Vertical and Lateral Power MOSFETs for Integrated DC-DC Converters. In IEEE Transactions on Nuclear Science, Vol. 57(4):1790-1797, August 2010. URL
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