R. Bettancourt, L. Szczecinski and
R Feick. Probability Density Function of Reliability Metrics in BICM with Arbitrary Modulation: Closed-form through Algorithmic Approach. In IEEE Global Telecommunications Conference 2006, San Francisco, USA, November 2006.
@InProceedings{bettan_etal:2006:b,
AUTHOR = {Bettancourt, R. and Szczecinski, L. and Feick, R},
TITLE = {Probability Density Function of Reliability Metrics in BICM with Arbitrary Modulation: Closed-form through Algorithmic Approach},
YEAR = {2006},
MONTH = {November},
BOOKTITLE = {IEEE Global Telecommunications Conference 2006},
ADDRESS = {San Francisco, USA}
}
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